100ns Pulse Bar Tester
Edge Emitting Laser Chip Testing and Sorting System
VCSEL Wafer Tester
普賽斯(PREISE) / CHIP25401
Edge Emitting Laser Chip Testing and Sorting System
CHIP25401 applies to wafer normal temperature/high temperature PIV and spectral tests, and classifies the different test results.
The testing stage can be translated and rotated to support tiled cavity chip testing. It supports integrating sphere, large area PD, collimated coupling, and horizontal/vertical far field pattern testing.
Far field patter testing: supports both for horizontal and vertical direction swing-arm scanning, and accuracy within 0.1°.
- With multiple probe structures. Maximum supports up to 5 probes and built in probe force monitoring system with real-time feedback.
Note: If the chip design is more than 5 electrodes, it is available to support with customized probe card.
Features
- Vision system provides automatic chip searching and OCR (Optical Character Recognition) function.
- Dual probe structure, automatic power driving. The adjustable probe force with real-time monitoring.
- TEC temperature control: room temperature 15~30℃ and high temperature 30~90℃.
- The integrating sphere captures the emitting light and tests PIV and spectral characteristics.
- Test sorting, and OK chips are automatically classified into categories according to the testing results.
- Output configuration supports 6 BinBlock or 4 Gelpaks.
- Abnormal conditions during the production process have alarm prompts and error correction prompt functions.
Technical specification
| Item | Specification |
|---|---|
| Suitable for Chip Size | Cavity Length x Width x Hight：600-4000 μm x 250-1000 μm x 90-150 μm Other sizes of nozzles and testing stages can be customized. |
| Measurement Items | LIV (Ith, Po, Vf, Im, Rs, SE, Kink, etc.), wavelength (λ), divergence angle (FFP), EA, SOA |
| Source Meter Specifications | PRECISE PLT2302 Continuous Wave continuous wave： *0~0.2A，±(0.05%RDG+0.05mA) *0~1A，±(0.05%RDG+0.25mA) *0~5A，±(0.05%RDG+1.25mA) Quasi-Continuous Wave quasi-continuous wave：Mini. pulse width 10μs，Max. duty cycle 30% *0~0.2A，±(0.05%RDG+0.05mA) *0~1A，±(0.05%RDG+0.25mA) *0~5A，±(0.05%RDG+1.25mA) *0~10A，±(0.05%RDG+2.5mA) |
| LD/SOA Driving Current | Mini. pulse width 100μs, Max. duty cycle 100%. Continuous wave possible. |
| EA Driver | Voltage: -10V~10V Measure EA current 0~200mA |
| Wavelength Testing | Power +20~-90dbm; Accuracy 0.1% FS±50uW; Resolution 0.1nm; Corresponding accuracy 0.3nm; Wavelength range 600~1700nm; Corresponding speed 0.2s/100nm The customer can assign /designate model(type) of Yokogawa or Arnitsu. |
| Optical Power Test | Max. input power ≤2W |
| Optical Power Collection | PD direct collection or fiber coupling combined with PD collection to test the extinction ratio |
| Divergence Angle | ±45°, Resolution ± 0.072° |
| Temperature Control | 15~90℃; Stability ≤ ±1℃ (actual measurement ≤0.2℃) |
Model Configuration List
CHIP25401-X
| Model | Specification |
|---|---|
| PSS CHIP15401-E | EML Single Temperature Tester |
| PSS CHIP15401-EF | EML+FFP Single Temperature Tester |
| PSS CHIP15401-ES | EML+SOA Single Temperature Tester |
| PSS CHIP15401-ESF | EML+SOA+FFP Single Temperature Tester |
| PSS CHIP25401-E | EML Dual Temperature Tester |
| PSS CHIP25401-EF | EML+FFP Dual Temperature Tester |
| PSS CHIP25401-ES | EML+SOA Dual Temperature Tester |
| PSS CHIP25401-ESF | EML+SOA+FFP Dual Temperature Tester |
| PSS CHIP25401-LT | EML+SOA Dual Temperature (including low temperature) Tester |
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