普賽斯｜測試儀｜ROSA 25001 - 台灣精密科技有限公司普賽斯、Precise、綜合測試儀

ROSA Comprehensive Tester

The ROSA device comprehensive test system is used to test various performance parameters of 25G ROSA devices.

The test system simulates the actual application environment of ROSA devices and automatically and quickly tests ROSA device performance parameters. It can quickly achieve true value test of sensitivity and fixed-point test of bit error rate.

Specification

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Features

Adopting a plug-in card combination solution, including a high-speed bit error analyzer, detector comprehensive analyzer, optical variable attenuator, optical power meter (optional according to needs).
Various parameters of APD devices can be tested: VBR, dark current, sensitivity, saturated optical power, and responsivity.
Various parameters of PIN devices can be tested: dark current, sensitivity, saturated optical power, and responsivity.
Design device protection measures, including static electricity, surge, over-current protection, APD power-on sequence control, etc.

Technical Specifications

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Item Spec.
Variable Bitrate 0~60V；0.5%±0.1V
Test Rate 24.33~32Gbps
Sensitivity Stability Short period: <±0.3dB
Dark Current Test 0~200nA；3%±2nA
Icc Test (Quiescent supply current) 0~150mA；1%±1mA
Response Current (Iapd) 0~200uA；1%±0.5uA
Sensitivity Search Time 16s (Typical Value)

Item	Spec.
Variable Bitrate	0~60V；0.5%±0.1V
Test Rate	24.33~32Gbps
Sensitivity Stability	Short period: <±0.3dB
Dark Current Test	0~200nA；3%±2nA
Icc Test (Quiescent supply current)	0~150mA；1%±1mA
Response Current (Iapd)	0~200uA；1%±0.5uA
Sensitivity Search Time	16s (Typical Value)