AE8595T High Performance Optical Spectrum Analyzer
AE8595T is a diffraction grating spectrum analyzer for optical fiber signal spectrum analysis. It operates in the wavelength range of 600 to 1700nm, with a max. resolution of 30pm, a max. measurement power of +23dBm, and a power sensitivity as low as -90dBm.
It can be used for semiconductor laser (DFB, FP) spectrum characteristic measurement, WDM system testing, EDFA system parameter testing, transmittance and drift testing.
Features 
- Spectral range 600nm~1700nm, suitable for single-mode and multi-mode fiber input.
- 7 wavelength resolution settings from 30pm to 2nm, users can select the best value based on testing requirements.
- Sensitivity settings as low as -90dBm.
- 74dB large dynamic range, capable of effectively separating similar spectral signals and performing precise measurements.
- ±0.015nm high wavelength accuracy, built-in wavelength calibration function.
- High noise light suppression rate, monochromator design can provide excellent stray light suppression capability.
- Rich functional options such as WDM, light source, EDFA, etc.
- Data interface supports Ethernet, USB, GP-IB, etc.
- Build automated inspection and testing systems based on customer requirements.
Application
EDFA Performance Measurement
- PSSE：Spontaneous radiation power of the light source
- PASE：EDFA amplified spontaneous emission power
- Gain
- Noise Factor
DFB Light Source Measurement
- Central wavelength
- Center wavelength power and total power bandwidth
- Bandwidth
- SMSR：Side Mode Suppression Ratio
- OSNR：Signal-to-Noise Ratio
- Central wavelength shift
WDM Channel Measurements
- Channel wavelength and power
- Channel Offset
- OSNR：In-band and out-of-band signal-to-noise ratio
- Bandwidth
FP Light Source Measurement
- Central wavelength
- RMS Width vs. FWHM
- Power
- Bandwidth
- Mode Interval
Gas Detection & Concentration Measurement
- When used with a broadband light source such as a Super-Continuum (SC) or Super-radiant Light-emitting Diode (SLD)，the AE8595T can display the optical absorption spectrum of the measured gas mixture.
Notch Bandwidth Measurement
- E8595T measures the passband bandwidth or stopband bandwidth from the measurement waveform of V-characteristic or U-characteristic filter through notch bandwidth measurement.
Function
Measurement
| Measurement Mode | CW light、Pulsed light、Air/Vacuum wavelength |
| Scan Mode | Repeat、Single、Automatic setting、Scan between line markers |
| Conditional Setting | Central wavelength、 Span、Number of sampling points、Wavelength resolution、Sensitivity Double speed mode、Smoothing、APC power compensation |
Display
| Vertical Axis Scale | Power scale (0.1~10dB/div., linear)、Power auxiliary scale (0.1~10dB/div., linear)、Reference power、Partitions (8, 10, 12)、Power spectrum width (dB/nm)、dB/km、%、Noise shielding |
| Horizontal Axis Scale | Wavelength (nm)、Frequency (THz)、Waveform Zoom |
| Display Mode & Project | Normal display、Split screen display、Data table、Label、Template、Measurement conditions |
Curve
| Curve Function | 7 independent curves、Max./Min. value hold、Calculation between curves、Standardized display、Curve fitting、Peak curve fitting、Marker curve fitting、Rolling average (2~100 times) |
| Others | Curve copy/Clear function、Write/Fix setting、Display/Blank setting |
Mark & Search
| Mark | Triangle mark (Max.1024)、Vertical/Horizontal line mark、Advanced mark |
| Search | Peak、Valley、Next Peak、Next Valley、Multiple Peaks、Multiple Valleys、Auto Search (On/OFF)、Search between horizontal markers、Search zoom area |
Data Analysis
| Analysis Function | Spectral width (Threshold、Envelope、RMS、Peak-RMS、Notch)、WDM (OSNR) Analysis、EDFA-NF analysis、Filter peak/Trough analysis、WDM filter peak/Trough analysis、DFB-LD/FP-LD/LED analysis、SMSR analysis、Power analysis、PMD analysis |
| Others | Automatic analysis (ON/OFF)、Analysis between horizontal line markers、Analysis within zoom area |
Other Function
| Wavelength Calibration | Automatic wavelength calibration with built-in wavelength reference source |
Instrument Size
Technical Specifications
Spectral Measurement
| Input Fiber | SM (9.5 / 125μm) MMF (50 / 125μm、62.5 / 125μm) |
| Wavelength Range | 600 ~ 1700nm |
| Resolution Bandwidth | 0.03 ~ 2nm |
| Resolution Setting | 0.03nm、0.05nm、0.1nm、0.2nm、0.5nm、1nm、2nm |
| Wavelength Accuracy | 1520 to 1620nm ±0.015nm 1450 to 1520nm ±0.025nm Full Range ±0.08nm |
| Wavelength Repeatability | ±0.01nm (1 minute) |
| Wavelength Linearity | ±0.015nm (1520 to 1580nm) ±0.025nm (1450 to 1520nm, 1580 to 1620nm) |
| Min. Sampling Resolution | 0.001nm |
Power Measurement
| Power Sensitivity | -90dBm (1300-1620nm, Resolution ≧ 0.05nm) -85dBm (1000-1300nm，Resolution ≧ 0.05nm) -55dBm (600-1000nm，Resolution ≧ 0.05nm) |
| Max. Input Power | +23dBm |
| Power Accuracy | ±0.3dB (1310 / 1550nm，Input power：-20dBm) |
| Power Linearity | ±0.08dB (Input power：-50 ~ +10dBm) |
| Max. Number of Sampling | 50001 |
| Optical Return Loss | 35dB (Using APC interface) |
| Polarization Dependence | ±0.08dB (1550nm) |
| Optical Dynamic Range | Peak wavelength ±0.1nm 45dB (Resolution：0.03nm) Peak wavelength ±0.4nm 70dB (Resolution：0.05nm) Peak wavelength ±1.0nm 74dB (Resolution：0.05nm) |
| Pulse Testing Conditions | Pulse width ≥10ns，Pulse frequency ≥10kHz |
Technical specification
| Display | 10.1in 1280×800 capacitive touch screen |
| Interface | USB2.0 ×5，USB 3.0，VGA，GP-IB Ethernet (10M/100M/1000M), RS232-DB9 |
| Power Supply | AC parameters 100~240V 1.7A 50~60Hz |
| Factory Installed Options |  Optical input interface adapter FC/SC optional GP-IB Interface Built-in calibrated light source FC  SC |
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