Japanese brand LD Chip Tester
LD Chip Tester, to measure bare chip with electrical and optical features (for optical communication). Also support binning.
Support temperature control
- 雙測試平台
- The Testing stage support temperature control
- Temperature control range: 20°C ~ 95°C
- OCR功能
Input/Output form
- Input form: 6″ Double Ring x1
- Output form: 6″ Double Ring x2 + NG Shooter
- 是否含OSA可談
English 
繁體中文