熙之翼電子(EET)


First exquisite milling process, providing high-quality and high-precision test probe needles.

  • Core product apply for LED chip/wafer test probe needle but also suitable for semiconductor field.
  • Widely apply for testing PCB, FPC, ICT, FCT, connectors and other circuit components.
  • Adopted and cooperated with many major universities and listed companies in China.

三種型號圖紙
Three models drawings
250倍顯微鏡實物圖
250x microscope image
500倍顯微鏡實物圖
500x microscope image
1000倍顯微鏡實物圖
1000x microscope image
工藝比較圖
Process comparison diagram
工藝極限
Process limit (2500x measurement)
頭部形狀
Head Type (1000x measurement)
Three options: Round-head, Flat-head, Pointed-head
細節實物圖
Details image
友商針型對比圖
Comparison diagram of needle types of competitors (1000x measurement)

Product List


Product Description

探針種類
Probe Types – L-type needle / C-type needle / N-type needle
探針種類
Probe Types – Silver-plated straight needle / Gold-plated straight needle / Tungsten-alloy straight needle
探針顯微鏡實物圖
Microscope Photos – 250x / 500x / 1000x
Tip Details
探針針尖針型
Tip Type – Narrow R type / Flat R type / Round R type
Various Materials – Copper-alloy probe / Silver-plated probe / Gold-plated probe / Tungsten-alloy probe / SK-alloy probe

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