BOSA Comprehensive Tester
The BOSA device comprehensive test system is a system used to test various performance parameters of BOSA components. It supports up to 15G rate testing and is often used for the synthesis of 10G and 2.5G BOSA devices.
性能測試。
This system simulates the actual application environment of BOSA devices and automatically and quickly tests nearly 20 types performance parameters of BOSA devices.
Features
- Adopting a plug-in card combination solution, including a high-speed bit error analyzer, detector comprehensive analyzer, laser comprehensive analyzer, optical variable attenuator, optical power meter (optional according to needs), and optical distribution unit, with high integration flexibility .
- Various parameters of APD devices can be tested: VBR, dark current, sensitivity, saturated optical power, optical isolation, and responsivity.
- Various parameters of PIN devices can be tested: dark current, sensitivity, saturated optical power, optical isolation, and responsivity.
- LD devices can be tested: threshold current, MPD dark current, forward voltage, backlight current, optical power, slope efficiency, Kink point, etc.
- Simulates a duplex working environment to test the isolation and optical crosstalk of BOSA devices.
- Design device protection measures, including static electricity, surge, over-current protection, APD power-on sequence control, etc.
Technical Specifications
RX
Item Spec. Variable Bitrate 0~60V；0.5%±0.1V Test Rate 622M、1.25G、2.5G、10Gbps、15Gbps Sensitivity Stability Short period: <±0.3dB Dark Current Test 0~200nA；3%±2nA Icc Test (Quiescent supply current) 0~150mA；1%±1mA Response Current (Iapd) 0~200uA；1%±0.5uA XTalk 30~50dB；±1dB Sensitivity Search Time 16s (Typical Value) TX
Item Spec. LD Drive Current Range 0~100mA；0.1%±0.1mA Backlight Detection Range 0~2500uA；0.1%±5uA Optical Power Detection Range 0~10mW；1%±50uW LD Forward Voltage 0~3.0V；0.5%±0.01V PD Dark Current 0~100nA；3%±2nA
Typical Data
Sensitivity Repeatability
EOS Waveform
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