Japanese brand LD Chip Tester
LD Chip Tester, to measure bare chip with electrical and optical features (for optical communication). Also support binning.
Support temperature control
- Single testing stage
- The Testing stage support temperature control
- 溫度範圍20°C至95°C
- Without OCR function
Input/Output form
- Input form: 6″ Double Ring x1
- Output form: 6″ Double Ring x2 + NG Shooter
English 
繁體中文